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Usure et rupture - Breaking points

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ISBN: 9782869064638 Year: Language: French
Publisher: Presses universitaires François-Rabelais
Added to DOAB on : 2017-07-04 12:27:07
License: OpenEdition licence for Books

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Certain recurrent ideas emerge through the rich diversity of papers collected here under the title Usure et Rupture: the necessity of cultural memory in finding an idiom, the rupture of form to provide a new text which makes sense of the past from the viewpoint of the present, the ways in which the image of usury plays an ambiguous role-both fructifying and economizing the text. A translator's delight, rupture in English can be variously rendered by break up, breaking up, parting, severance, ...

Aspettando il Sessantotto : Continuità e fratture nelle culture politiche italiane dal 1956 al 1968

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ISBN: 9788899982171 DOI: 10.4000/books.aaccademia.1610 Language: Italian
Publisher: Accademia University Press
Subject: Political Science
Added to DOAB on : 2019-12-06 13:15:22
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Nei contributi qui presentati, vengono analizzati alcuni momenti e figure della vita e del dibattito politico in Italia, nel dodicennio che precede l’esplosione del 1968. Sono evidenziati – nella continuità delle diverse culture politiche – gli elementi di discontinuità, le incrinature, i dissensi, le eterodossie, le polemiche: tutto ciò che in qualche modo, può essere considerato un dato “preparatorio” del sommovimento di fine decennio.

Keywords

1968 --- culture politique --- rupture --- Italie --- continuité

La (dis)continuité en Droit

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ISBN: 9782379280320 DOI: 10.4000/books.putc.745 Language: French
Publisher: Presses de l’Université Toulouse 1 Capitole
Subject: Law
Added to DOAB on : 2019-12-06 13:15:52
License: OpenEdition Licence for Books

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Le thème de la (dis)continuité en Droit ne peut laisser indifférent nul juriste, nul historien ou théoricien du Droit. Les communications rassemblées dans cet ouvrage en témoignent par leur diversité disciplinaire. Pour aborder un tel objet d'étude d'une redoutable ampleur, l'axe temporel et l'axe spatial ont été retenus. Sur l'axe du temps, la continuité se donne comme l'expression de la permanence des principes et des institutions résistant aux ruptures ; elle évoque une intangibilité rêvée. Face aux évolutions exigeant des abandons et des réformes, elle devient la résistance de l'existant, cédant difficilement par des réformes apparentes. Et quand l'abandon de l'ancien ne peut être évité, elle se transforme en transition qui ménage un pont au-dessus du fossé qui sépare (ou veut séparer) désormais le passé et le présent. Sur l'axe de l'espace, la continuité se manifeste dans les liaisons entre éléments d'un même ensemble processuel, normatif ou institutionnel. Elle préside encore à l'établissement de liens entre sphères d'activités ou d'intérêts connexes et entre territoires contigus. Ainsi, la continuité est au cœur des impératifs de sécurité et de cohérence juridiques, de pacification et de cohésion sociales.

Creep and High Temperature Deformation of Metals and Alloys

Authors: ---
ISBN: 9783039218783 / 9783039218790 Year: Pages: 212 DOI: 10.3390/books978-3-03921-879-0 Language: eng
Publisher: MDPI - Multidisciplinary Digital Publishing Institute
Subject: Technology (General) --- General and Civil Engineering --- Mining and Metallurgy
Added to DOAB on : 2020-01-07 09:08:26
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By the late 1940s, and since then, the continuous development of dislocation theories have provided the basis for correlating the macroscopic time-dependent deformation of metals and alloys—known as creep—to the time-dependent processes taking place within the metals and alloys. High-temperature deformation and stress relaxation effects have also been explained and modeled on similar bases. The knowledge of high-temperature deformation as well as its modeling in conventional or unconventional situations is becoming clearer year by year, with new contemporary and better performing high-temperature materials being constantly produced and investigated.This book includes recent contributions covering relevant topics and materials in the field in an innovative way. In the first section, contributions are related to the general description of creep deformation, damage, and ductility, while in the second section, innovative testing techniques of creep deformation are presented. The third section deals with creep in the presence of complex loading/temperature changes and environmental effects, while the last section focuses on material microstructure–creep correlations for specific material classes. The quality and potential of specific materials and microstructures, testing conditions, and modeling as addressed by specific contributions will surely inspire scientists and technicians in their own innovative approaches and studies on creep and high-temperature deformation.

Radiation Tolerant Electronics

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ISBN: 9783039212798 / 9783039212804 Year: Pages: 210 DOI: 10.3390/books978-3-03921-280-4 Language: eng
Publisher: MDPI - Multidisciplinary Digital Publishing Institute
Subject: Technology (General) --- General and Civil Engineering --- Electrical and Nuclear Engineering
Added to DOAB on : 2019-12-09 11:49:15
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Research on radiation-tolerant electronics has increased rapidly over the past few years, resulting in many interesting approaches to modeling radiation effects and designing radiation-hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation-hardened electronics for space applications, high-energy physics experiments such as those on the Large Hadron Collider at CERN, and many terrestrial nuclear applications including nuclear energy and nuclear safety. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their susceptibility to ionizing radiation has raised many exciting challenges, which are expected to drive research in the coming decade. In this book we highlight recent breakthroughs in the study of radiation effects in advanced semiconductor devices, as well as in high-performance analog, mixed signal, RF, and digital integrated circuits. We also focus on advances in embedded radiation hardening in both FPGA and microcontroller systems and apply radiation-hardened embedded systems for cryptography and image processing, targeting space applications.

Keywords

physical unclonable function --- FPGA --- total ionizing dose --- Co-60 gamma radiation --- ring-oscillator --- Image processing --- line buffer --- SRAM-based FPGA --- single event upset (SEU) --- configuration memory --- soft error --- radiation-hardened --- instrumentation amplifier --- sensor readout IC --- total ionizing dose --- nuclear fusion --- radiation hardening --- hardening by design --- TMR --- selective hardening --- VHDL --- FPGA --- radiation hardening --- single event upsets --- heavy ions --- error rates --- single-event upsets (SEUs) --- digital integrated circuits --- triple modular redundancy (TMR) --- radiation hardening by design --- TMR --- FMR --- 4MR --- triplex–duplex --- FPGA-based digital controller --- radiation tolerant --- single event effects --- proton irradiation --- RFIC --- SEE testing --- space application --- CMOS --- TDC --- radiation effects --- total ionizing dose (TID) --- single-shot --- PLL --- ring oscillator --- analog single-event transient (ASET) --- bandgap voltage reference (BGR) --- CMOS analog integrated circuits --- gamma-rays --- heavy-ions --- ionization --- protons --- radiation hardening by design (RHBD) --- reference circuits --- single-event effects (SEE) --- space electronics --- total ionization dose (TID) --- voltage reference --- X-rays --- radiation-hardened --- single event gate rupture (SEGR) --- SEB --- power MOSFETs --- Single-Event Upsets (SEUs) --- radiation effects --- Ring Oscillators --- Impulse Sensitive Function --- Radiation Hardening by Design --- fault tolerance --- single event upset --- proton irradiation effects --- neutron irradiation effects --- soft errors --- saturation effect --- gain degradation --- total ionizing dose --- gamma ray --- bipolar transistor --- single event transient (SET) --- single event opset (SEU) --- radiation-hardening-by-design (RHBD) --- frequency synthesizers --- voltage controlled oscillator (VCO) --- frequency divider by two --- CMOS --- n/a

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