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Melting Hadrons, Boiling Quarks: From Hagedorn Temperature to Ultra-Relativistic Heavy-Ion Collisions at CERN: With a Tribute to Rolf Hagedorn

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ISBN: 9783319175447 9783319175454 Year: Pages: 439 DOI: 10.1007/978-3-319-17545-4 Language: English
Publisher: Springer
Subject: Astronomy (General) --- Business and Management --- Physics (General)
Added to DOAB on : 2015-11-03 13:55:41
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This book shows how the study of multi-hadron production phenomena in the years after the founding of CERN culminated in Hagedorn's pioneering idea of limiting temperature, leading on to the discovery of the quark-gluon plasma -- announced, in February 2000 at CERN.Following the foreword by Herwig Schopper -- the Director General (1981-1988) of CERN at the key historical juncture -- the first part is a tribute to Rolf Hagedorn (1919-2003) and includes contributions by contemporary friends and colleagues, and those who were most touched by Hagedorn: Tamás Biró, Igor Dremin, Torleif Ericson, Marek Gaździcki, Mark Gorenstein, Hans Gutbrod, Maurice Jacob, István Montvay, Berndt Müller, Grazyna Odyniec, Emanuele Quercigh, Krzysztof Redlich, Helmut Satz, Luigi Sertorio, Ludwik Turko, and Gabriele Veneziano.The second and third parts retrace 20 years of developments that after discovery of the Hagedorn temperature in 1964 led to its recognition as the melting point of hadrons into boiling quarks, and to the rise of the experimental relativistic heavy ion collision program. These parts contain previously unpublished material authored by Hagedorn and Rafelski: conference retrospectives, research notes, workshop reports, in some instances abbreviated to avoid duplication of material, and rounded off with the editor's explanatory notes.

Charged Particles in Oncology

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Book Series: Frontiers Research Topics ISSN: 16648714 ISBN: 9782889453917 Year: Pages: 650 DOI: 10.3389/978-2-88945-391-7 Language: English
Publisher: Frontiers Media SA
Subject: Medicine (General) --- Oncology
Added to DOAB on : 2018-11-16 17:17:57
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High-energy charged particles represent a cutting-edge technique in radiation oncology. Protons and carbon ions are used in several centers all over the world for the treatment of different solid tumors. Typical indications are ocular malignancies, tumors of the base of the skull, hepatocellular carcinomas and various sarcomas. The physical characteristics of the charged particles (Bragg peak) allow sparing of much more normal tissues than it is possible using conventional X-rays, and for this reason all pediatric tumors are considered eligible for protontherapy. Ions heavier than protons also display special radiobiological characteristics, which make them effective against radioresistant and hypoxic tumors. On the other hand, protons and ions with high charge (Z) and energy (HZE particles) represent a major risk for human space exploration. The main late effect of radiation exposure is cancer induction, and at the moment the dose limits for astronauts are based on cancer mortality risk. The Mars Science Laboratory (MSL) measured the dose on the route to Mars and on the planet’s surface, suggesting that a human exploration missions will exceed the radiation risk limits. Notwithstanding many studies on carcinogenesis induced by protons and heavy ions, the risk uncertainty remains very high. In this research topic we aim at gathering the experiences and opinions of scientists dealing with high-energy charged particles either for cancer treatment or for space radiation protection. Clinical results with protons and heavy ions, as well as research in medical physics and pre-clinical radiobiology are reported. In addition, ground-based and spaceflight studies on the effects of space radiation are included in this book. Particularly relevant for space studies are the clinical results on normal tissue complications and second cancers. The eBook nicely demonstrates that particle therapy in oncology and protection of astronauts from space radiation share many common topics, and can learn from each other.

Radiation Tolerant Electronics

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ISBN: 9783039212798 / 9783039212804 Year: Pages: 210 DOI: 10.3390/books978-3-03921-280-4 Language: eng
Publisher: MDPI - Multidisciplinary Digital Publishing Institute
Subject: Technology (General) --- General and Civil Engineering --- Electrical and Nuclear Engineering
Added to DOAB on : 2019-12-09 11:49:15
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Research on radiation-tolerant electronics has increased rapidly over the past few years, resulting in many interesting approaches to modeling radiation effects and designing radiation-hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation-hardened electronics for space applications, high-energy physics experiments such as those on the Large Hadron Collider at CERN, and many terrestrial nuclear applications including nuclear energy and nuclear safety. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their susceptibility to ionizing radiation has raised many exciting challenges, which are expected to drive research in the coming decade. In this book we highlight recent breakthroughs in the study of radiation effects in advanced semiconductor devices, as well as in high-performance analog, mixed signal, RF, and digital integrated circuits. We also focus on advances in embedded radiation hardening in both FPGA and microcontroller systems and apply radiation-hardened embedded systems for cryptography and image processing, targeting space applications.

Keywords

physical unclonable function --- FPGA --- total ionizing dose --- Co-60 gamma radiation --- ring-oscillator --- Image processing --- line buffer --- SRAM-based FPGA --- single event upset (SEU) --- configuration memory --- soft error --- radiation-hardened --- instrumentation amplifier --- sensor readout IC --- total ionizing dose --- nuclear fusion --- radiation hardening --- hardening by design --- TMR --- selective hardening --- VHDL --- FPGA --- radiation hardening --- single event upsets --- heavy ions --- error rates --- single-event upsets (SEUs) --- digital integrated circuits --- triple modular redundancy (TMR) --- radiation hardening by design --- TMR --- FMR --- 4MR --- triplex–duplex --- FPGA-based digital controller --- radiation tolerant --- single event effects --- proton irradiation --- RFIC --- SEE testing --- space application --- CMOS --- TDC --- radiation effects --- total ionizing dose (TID) --- single-shot --- PLL --- ring oscillator --- analog single-event transient (ASET) --- bandgap voltage reference (BGR) --- CMOS analog integrated circuits --- gamma-rays --- heavy-ions --- ionization --- protons --- radiation hardening by design (RHBD) --- reference circuits --- single-event effects (SEE) --- space electronics --- total ionization dose (TID) --- voltage reference --- X-rays --- radiation-hardened --- single event gate rupture (SEGR) --- SEB --- power MOSFETs --- Single-Event Upsets (SEUs) --- radiation effects --- Ring Oscillators --- Impulse Sensitive Function --- Radiation Hardening by Design --- fault tolerance --- single event upset --- proton irradiation effects --- neutron irradiation effects --- soft errors --- saturation effect --- gain degradation --- total ionizing dose --- gamma ray --- bipolar transistor --- single event transient (SET) --- single event opset (SEU) --- radiation-hardening-by-design (RHBD) --- frequency synthesizers --- voltage controlled oscillator (VCO) --- frequency divider by two --- CMOS --- n/a

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