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Detection and characterization of inclusions in impedance tomography
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Author: Schmitt, Susanne
ISBN: 9783866446359 Year: 2011 Pages: VIII, 135 p. DOI: 10.5445/KSP/1000021838 Language: ENGLISH
Publisher: KIT Scientific Publishing
Subject: Computer Science
Added to DOAB on : 2019-07-30 20:01:57
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ISBN: 9783866446359 Year: 2011 Pages: VIII, 135 p. DOI: 10.5445/KSP/1000021838 Language: ENGLISH
Publisher: KIT Scientific Publishing
Subject: Computer Science
Added to DOAB on : 2019-07-30 20:01:57
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Abstract
The topic of this work are two further developments of the Factorization method for electrical impedance tomography.We present a modification of this method that is capable of detecting mixed inclusions, i.e. both inclusions with a higher as well as inclusions with a lower conductivity than the background medium. In addition, we derive a new method to compute the conductivity inside inclusions after they have been localized.
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